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Search for "contact resonances" in Full Text gives 4 result(s) in Beilstein Journal of Nanotechnology.

Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

  • Wenting Wang,
  • Chengfu Ma,
  • Yuhang Chen,
  • Lei Zheng,
  • Huarong Liu and
  • Jiaru Chu

Beilstein J. Nanotechnol. 2019, 10, 1636–1647, doi:10.3762/bjnano.10.159

Graphical Abstract
  • frequency shifts of the contact resonances. Therefore, CR-AFM is expected to also possess the ability of nondestructively detecting the buried circuit structures. Nevertheless, a systematic investigation on the influences of various experimental parameters is still of critical importance to enable
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Published 07 Aug 2019

A robust AFM-based method for locally measuring the elasticity of samples

  • Alexandre Bubendorf,
  • Stefan Walheim,
  • Thomas Schimmel and
  • Ernst Meyer

Beilstein J. Nanotechnol. 2018, 9, 1–10, doi:10.3762/bjnano.9.1

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  • elastic modulus from Δf22/Δf1. The method was used to give an estimate of the Young’s modulus of the FDTS thin film. Keywords: atomic force microscopy; contact resonances; elastic modulus; 1H,1H,2H,2H-perfluorodecyltrichlorosilane (FDTS); polymers; Young’s modulus; Introduction Knowledge of the local
  • disadvantages, both methods are particularly interesting because of the complementarity of their advantages. The method of Hurley and Turner [6], which is based on tracking the first flexural and torsional contact resonances, has the advantage of staying stable even if the measurements are performed in non-dry
  • robustness of the measuring method based on contact resonances. Since the range of elasticity values of polymers is covered by the domain of validity of the theoretical model, those values were used for testing the new method. Principle of the Method Theoretical model The method is based on the theoretical
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Published 02 Jan 2018

Mapping of elasticity and damping in an α + β titanium alloy through atomic force acoustic microscopy

  • M. Kalyan Phani,
  • Anish Kumar,
  • T. Jayakumar,
  • Walter Arnold and
  • Konrad Samwer

Beilstein J. Nanotechnol. 2015, 6, 767–776, doi:10.3762/bjnano.6.79

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  • acoustic microscopy; contact resonances; damping; indentation modulus; Ti-6Al-4V; Introduction The physical and mechanical properties of the individual phases govern the respective properties of the multiphase structural materials. The knowledge of elastic properties of the individual phases is important
  • contact damping E″/E′, which we observe in our experiments, we neglect this effect. The values for an and bn are obtained by fitting Lorentzians to the experimentally obtained resonances curves of the free and contact resonances. Due to the local damping in the contact zone the contact stiffness becomes a
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Published 18 Mar 2015

Mapping mechanical properties of organic thin films by force-modulation microscopy in aqueous media

  • Jianming Zhang,
  • Zehra Parlak,
  • Carleen M. Bowers,
  • Terrence Oas and
  • Stefan Zauscher

Beilstein J. Nanotechnol. 2012, 3, 464–474, doi:10.3762/bjnano.3.53

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  • feedback control. A cantilever in contact has contact resonance modes [46] and the cantilever vibration amplitude is amplified at the contact resonance frequency, which increases with increasing surface stiffness. Contact resonances modes in air have been used to quantify the stiffness of surfaces [31
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Letter
Published 26 Jun 2012
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